Waste Management Symposia 2010
 

 

Session 18 - Waste Characterization - Instrumental Solutions

 

 

Chair(s):

Frazier Bronson, Canberra Industries Inc - AREVA Group (USA)
Stephen Croft, Los Alamos National Laboratory (USA)

 

 

Order

Paper Title

1 

The Efficiency Calibration of Non-Destructive Gamma Assay Systems Using Semi-Analytical Mathematical Approaches - 10497
Dante Nakazawa, Canberra Industries Inc - AREVA Group (USA); Frazier Bronson, Canberra Industries Inc - AREVA Group (USA); Stephen Croft, Los Alamos National Laboratory (USA); Robert McElroy, Canberra Industries Inc - AREVA Group (USA); Wilhelm Mueller, Canberra Industries Inc - AREVA Group (USA); Ram Venkataraman, Canberra Industries Inc - AREVA Group (USA)  

2 

Gamma-Ray Self Attenuation in Performance Demonstration Plan Sources - 10480
Wilhelm Mueller, Canberra Industries Inc - AREVA Group (USA); Stephen Croft, Los Alamos National Laboratory (USA)  

3 

The Special Properties of Massimetric Efficiency Calibrations as Compared to the Traditional Efficiency Calibration for D&D and ER Gamma Spectroscopy Measurements - 10021
Frazier Bronson, Canberra Industries Inc - AREVA Group (USA)  

4

Waste Assay at the Free Release Threshold Using a Box Monitor - 10007
Timothy Miller, AWE (United Kingdom)  

5 

Nuclear Calorimetry - "Dispelling the Myths" - 10443
Sasha Philips, Canberra Industries Inc - AREVA Group (USA); Stephen Croft, Los Alamos National Laboratory (USA); Louise Evans, Los Alamos National Laboratory (USA); Juliette Guerault , Setaram Instrumentation (France); Christophe Mathonat, Setaram Instrumentation (France); L. Passelegue, Setaram Instrumentation (France); Guillaume Jossens, SETARAM Instrumentation (France)  

6

Performance Assessment of the Add-A-Source Matrix Correction Method Using the Super High Efficiency Neutron Coincidence Counting System (SuperHENC) - 10527
Alan Simpson, Pajarito Scientific Corporation (UK); T. A. Peterson, Pajarito Scientific Corporation (USA); S.A. McElhaney, Pajarito Scientific Corporation (USA)  

7 

TRU/LLW Segregation Using Passive Neutron Coincidence Counting - 10072
Jamie Rackham, VT Group (United Kingdom); Mark Wilson, VT Group (United Kingdom); Jonathan Sharpe, VT Group (United Kingdom)  



 


    Copyright 2010 WM Symposia
 

 

Produced by X-CD Technologies Inc.